Static Secondary-ion Mass Spectrometry - Spectrum

Spectrum

The mass spectrum of the secondary ions emitted from the bombarded surface during SSIMS provides direct information of not only chemical composition but also of chemical structure of the bombarded area. This is because the mass spectrum includes cluster ions as well as elemental ions. These cluster ions reflect the surface chemistry in a detailed way. Figure shows the mass spectrum obtained from a SSIMS analysis of polytetrafluoroethylene (PTFE). Positive ion spectrum shows positive atomic ion (i.e. C+) and molecular ions (i.e. CF+, CF3+, C3F3+) of the target. Negative ion spectrum shows the atomic ion (i.e. F-) and molecular ions (i.e. F2-, CF3-, C3F3-).