Static secondary-ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or plastic with insignificant disturbance to its composition and structure. It is one of the two principal modes of operation of SIMS, which is the mass spectrometry of ionized particles emitted by a solid (or sometimes liquid) surface upon bombardment by energetic primary particles.
Read more about Static Secondary-ion Mass Spectrometry: Mechanism, Primary Operating Conditions, Spectrum, History of Static SIMS
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“While this America settles in the mould of its vulgarity, heavily
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—Robinson Jeffers (1887–1962)