Reflection high-energy electron diffraction (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that also rely on diffraction of high-energy electrons. Transmission electron microscopy, another common electron diffraction method samples the bulk of the sample due to the geometry of the system. Low-energy electron diffraction (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.
Read more about Reflection High-energy Electron Diffraction: Introduction, Surface Diffraction, RHEED Patterns of Real Surfaces
Famous quotes containing the word reflection:
“But before the extremity of the Cape had completely sunk, it appeared like a filmy sliver of land lying flat on the ocean, and later still a mere reflection of a sand-bar on the haze above. Its name suggests a homely truth, but it would be more poetic if it described the impression which it makes on the beholder.”
—Henry David Thoreau (1817–1862)