Reflection high-energy electron diffraction (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that also rely on diffraction of high-energy electrons. Transmission electron microscopy, another common electron diffraction method samples the bulk of the sample due to the geometry of the system. Low-energy electron diffraction (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.
Read more about Reflection High-energy Electron Diffraction: Introduction, Surface Diffraction, RHEED Patterns of Real Surfaces
Famous quotes containing the word reflection:
“Fanny was not there! How she would have enjoyed the scene.... I could not but think of her, and in spite of my efforts to prevent, the unbidden tear would flow. Alas! I cannot feel the satisfaction some appear to do in the reflection that her eyes beheld the scene from the other world.”
—Rutherford Birchard Hayes (1822–1893)