Reflection high-energy electron diffraction (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that also rely on diffraction of high-energy electrons. Transmission electron microscopy, another common electron diffraction method samples the bulk of the sample due to the geometry of the system. Low-energy electron diffraction (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.
Read more about Reflection High-energy Electron Diffraction: Introduction, Surface Diffraction, RHEED Patterns of Real Surfaces
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“It is conceivable at least that a late generation, such as we presumably are, has particular need of the sketch, in order not to be strangled to death by inherited conceptions which preclude new births.... The sketch has direction, but no ending; the sketch as reflection of a view of life that is no longer conclusive, or is not yet conclusive.”
—Max Frisch (1911–1991)