Test Method
Voltage is applied to the MOS structure to force a controlled current through the oxide, i.e. to inject a controlled amount of charge into the dielectric layer. By measuring the time after which the measured voltage drops towards zero (when electrical breakdown occurs) and integrating the injected current over time, the charge needed to break the gate oxide is determined.
This gate charge integral is defined as:
where is the measurement time at the step just prior to destructive avalanche breakdown.
Read more about this topic: QBD (electronics)
Famous quotes containing the words test and/or method:
“To test a modest man’s modesty do not investigate if he ignores applause, find out if he abides criticism.”
—Franz Grillparzer (1791–1872)
“I have a new method of poetry. All you got to do is look over your notebooks ... or lay down on a couch, and think of anything that comes into your head, especially the miseries.... Then arrange in lines of two, three or four words each, don’t bother about sentences, in sections of two, three or four lines each.”
—Allen Ginsberg (b. 1926)