New PEEM Technologies
- Time resolve Photoemission electron microscopy (TR-PEEM): TR-PEEM is well suited for real-time observation of fast processes on surfaces equipped with pulsed synchrotron radiation for illumination.
- Time-of-flight Photoemission electron microscopy (TOF-PEEM): TOF-PEEM is PEEM using an ultrafast gated CCD camera or a time-and space-resolving counting detector for observing fast processes on surfaces.
- Multiphoton Photoemission electron microscopy: Multiphoton PEEM can be employed for the study of localized surface plasmon excitations in nanoclusters or for direct spatial observation of the hot-electron lifetime in structured films using femtosecond lasers.
Read more about this topic: Photoemission Electron Microscopy