Comparison From Other Techniques
- Transmission electron microscopy (TEM) and scanning electron microscopy (SEM): PEEM differs from these two microscopies by using an electric accelerating field at the surface of specimen. The specimen is part of the electron-optical system.
- Low-energy electron microscopy (LEEM) and mirror electron microscopy (MEM):These two electron emission microscopy use electron gun supply beams which are directed toward the specimen, decelerated and backscattered from the specimen or reflected just before reaching the specimen. In photoemission electron microscopy (PEEM) the same specimen geometry and immersion lens are used, but the electron guns are omitted.
Read more about this topic: Photoemission Electron Microscopy
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