Sampling Features
The standard also provides a schema for Sampling Features. Observations commonly involve sampling of the ultimate feature of interest. Specific sampling features, such as station, specimen, transect, section, are used in many application domains, and common processing and visualization tools are used. The standard defines a common set of sampling feature types classified primarily by spatial dimension, as well as samples for ex-situ observations. The schema includes relationships between sampling features (sub-sampling, derived samples).
The core properties of sampling features are:
- sampled feature - which links the sampling artefact with the real-world feature of interest
- related observation
- related sampling feature - linking sampling features into complexes
Read more about this topic: Observations And Measurements
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