Ultrasonic Force Microscopy (UFM) has been developed in order to improve the details and image contrast on "flat" areas of interest where the atomic force microscopy (AFM) images are limited in contrast. The combination of AFM-UFM allows a near field acoustic microscopic image to be generated. The AFM tip is used to detect the ultrasonic waves and overcomes the limitation of wavelength that occurs in acoustic microscopy. By using the elastic changes under the AFM tip, an image of much greater detail than the AFM topography can be generated.
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“The sure way of judging whether our first thoughts are judicious, is to sleep on them. If they appear of the same force the next morning as they did over night, and if good nature ratifies what good sense approves, we may be pretty sure we are in the right.”
—Horace Walpole (1717–1797)