Ultrasonic Force Microscopy (UFM) has been developed in order to improve the details and image contrast on "flat" areas of interest where the atomic force microscopy (AFM) images are limited in contrast. The combination of AFM-UFM allows a near field acoustic microscopic image to be generated. The AFM tip is used to detect the ultrasonic waves and overcomes the limitation of wavelength that occurs in acoustic microscopy. By using the elastic changes under the AFM tip, an image of much greater detail than the AFM topography can be generated.
Famous quotes containing the word force:
“Nations do not think, they only feel. They get their feelings at second hand through their temperaments, not their brains. A nation can be brought—by force of circumstances, not argument—to reconcile itself to any kind of government or religion that can be devised; in time it will fit itself to the required conditions; later it will prefer them and will fiercely fight for them.”
—Mark Twain [Samuel Langhorne Clemens] (1835–1910)