Magnetic Force Microscope - Scanning Procedure

Scanning Procedure

The scanning method when using an MFM is called the "lift height" method. When the tip scans the surface of a sample at close distances (< 10 nm), not only magnetic forces are sensed, but also atomic and electrostatic forces. The lift height method helps to enhance the magnetic contrast through the following:

• First, the topographic profile of each scan line is measured. That is, the tip is brought into a close proximity of the sample to take AFM measurements.
• The magnetized tip is then lifted further away from the sample.
• On the second pass, the magnetic signal is extracted.