Important Dates
A boost in the interest to MFM resulted from the following inventions :
1982 - Scanning Tunneling Microscopy (STM)
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- Tunneling current between the tip and sample is used as the signal.
- Both the tip and sample must be electrically conductive.
1986 - Atomic force microscopy (AFM)
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- Forces (atomic/electrostatic) between the tip and sample are sensed from the deflections of a flexible lever (cantilever).
- The cantilever tip flies above the sample with a typical distance of tens of nanometers.
1987 - Magnetic Force Microscopy (MFM)
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- Derives from AFM. The magnetic forces between the tip and sample are sensed.
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- Image of the magnetic stray field is obtained by scanning the magnetized tip over the sample surface in a raster scan.
Read more about this topic: Magnetic Force Microscope
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