Important Dates
A boost in the interest to MFM resulted from the following inventions :
1982 - Scanning Tunneling Microscopy (STM)
-
- Tunneling current between the tip and sample is used as the signal.
- Both the tip and sample must be electrically conductive.
1986 - Atomic force microscopy (AFM)
-
- Forces (atomic/electrostatic) between the tip and sample are sensed from the deflections of a flexible lever (cantilever).
- The cantilever tip flies above the sample with a typical distance of tens of nanometers.
1987 - Magnetic Force Microscopy (MFM)
-
- Derives from AFM. The magnetic forces between the tip and sample are sensed.
-
- Image of the magnetic stray field is obtained by scanning the magnetized tip over the sample surface in a raster scan.
Read more about this topic: Magnetic Force Microscope
Famous quotes containing the words important and/or dates:
“Losing face is as important to people as losing bark is to a tree.”
—Chinese proverb.
“What is most interesting and valuable in it, however, is not the materials for the history of Pontiac, or Braddock, or the Northwest, which it furnishes; not the annals of the country, but the natural facts, or perennials, which are ever without date. When out of history the truth shall be extracted, it will have shed its dates like withered leaves.”
—Henry David Thoreau (1817–1862)