Advantages
The popularity of MFM originates from several reasons, which include::
- The sample does not need to be electrically conductive.
- Measurement can be performed at ambient temperature, in ultra high vacuum (UHV), in liquid environment, and at different temperatures.
- Measurement is nondestructive to the crystal lattice or structure.
- Long-range magnetic interactions are not sensitive to surface contamination.
- No special surface preparation or coating is required.
- Deposition of thin non-magnetic layers on the sample does not alter the results.
- Detectable magnetic field intensity, H, is in the range of 10 A/m
- Detectable magnetic field, B, is in the range of 0.1 gauss (10 microteslas).
- Typical measured forces are as low as 10−14 N, with the spatial resolutions as low as 20 nm.
- MFM can be combined with other scanning methods like STM.
Read more about this topic: Magnetic Force Microscope
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