Field Ion Microscope

Field Ion Microscope

Field ion microscopy (FIM) is an analytical technique used in materials science. The field ion microscope is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip. It was the first technique by which individual atoms could be spatially resolved. On October 11, 1955, Muller & Bahadur (Pennsylvania State University) observed individual tungsten (W) atoms on the surface of a sharply pointed W tip by cooling it to 78 K and employing helium as the imaging gas. Muller & Bahadur were the first persons to observe individual atoms directly; to do so, they used an FIM, which Muller had invented in 1951.

Read more about Field Ion Microscope:  Introduction, Design, Limitations and Applications

Famous quotes containing the word field:

    Mothers seem to be in subtle competition with teachers. There is always an underlying fear that teachers will do a better job than they have done with their child.... But mostly mothers feel that their areas of competence are very much similar to those of the teacher. In fact they feel they know their child better than anyone else and that the teacher doesn’t possess any special field of authority or expertise.
    Sara Lawrence Lightfoot (20th century)