Electron Beam Induced Current
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties. EBIC is similar to cathodoluminescence in that it depends on the creation of electron–hole pairs in the semiconductor sample by the microscope's electron beam. This technique is used in semiconductor failure analysis and solid-state physics.
Read more about Electron Beam Induced Current: Physics of The Technique, Quantitative EBIC
Famous quotes containing the words beam, induced and/or current:
“How can one beam alone support a house?”
—Chinese proverb.
“The classicist, and the naturalist who has much in common with him, refuse to see in the highest works of art anything but the exercise of judgement, sensibility, and skill. The romanticist cannot be satisfied with such a normal standard; for him art is essentially irrational—an experience beyond normality, sometimes destructive of normality, and at the very least evocative of that state of wonder which is the state of mind induced by the immediately inexplicable.”
—Sir Herbert Read (1893–1968)
“Liberty, as it is conceived by current opinion, has nothing inherent about it; it is a sort of gift or trust bestowed on the individual by the state pending good behavior.”
—Mary McCarthy (1912–1989)