Diffraction Topography - Literature

Literature

  • Books (chronological order):
    • Tanner, Brian: X-ray diffraction topography. Pergamon Press (1976).ISBN 0080196926.
    • Authier, André and Lagomarsino, Stefano and Tanner, Brian K. (editors): X-Ray and Neutron Dynamical Diffraction - Theory and Applications. Plenum Press / Kluwer Academic Publishers (1996). ISBN 0-306-45501-3.
    • Bowen, Keith and Tanner, Brian: High Resolution X-Ray Diffractometry and Topography. Taylor and Francis (1998). ISBN 0-85066-758-5.
    • Authier, André: Dynamical theory of X-ray diffraction. IUCr monographs on crystallography, no. 11. Oxford University Press (1st edition 2001/ 2nd edition 2003). ISBN 0-19-852892-2.
  • Reviews
    • Lang, A. R.: Techniques and interpretation in X-ray topography. In: Diffraction and Imaging Techniques in Materials Science (edited by Amelinckx S., Gevers R. and Van Landuyt J.) 2nd ed. rev. (1978), pp 623–714. Amsterdam: North Holland.
    • Klapper, Helmut: X-ray topography of organic crystals. In: Crystals: Growth, Properties and Applications, vol. 13 (1991), pp 109–162. Berlin-Heidelberg: Springer.
    • Lang, A. R.: Topography. In: International Tables for Crystallography, Vol. C (1992), Section 2.7, p. 113. Kluwer, Dordrecht.
    • Tuomi, T: Synchrotron X-ray topography of electronic materials. Journal of Synchrotron Radiation (2002) 9, 174-178.
    • Baruchel, J. and Härtwig, J. and Pernot-Rejmánková, P.: Present state and perspectives of synchrotron radiation diffraction imaging. Journal of Synchrotron Radiation (2002) 9, 107-114.
  • Selected original articles (chronological order):
    • X-ray topography
      • C.S. Barrett: Phys. Rev. (1931) 38, 832-833.
      • W.L. Berg: Naturwissenschaften (1931) 19, 391-396.
      • G. Borrmann: Phys. Z. (1941) 42, 157.
      • A. Guinier and J. Tennevin: Acta Cryst. (1949) 2, 133-138.
      • W.L. Bond and J. Andrus: Am. Mineralogist (1952) 37, 622-632.
      • A. R. Lang: Acta Metallurgica (1957a) 5, 358-364.
      • A. R. Lang: Acta Cryst. (1957b) 10, 839.
      • A. R. Lang: J. Appl. Phys. (1958) 29, 597.
      • A.R. Lang: The projection topograph: A new method in X-ray diffraction microradiography. Acta Cryst. (1959) 12, 249-250.
      • T. Tuomi, K. Naukkarinen, E. Laurila, P. Rabe: Rapid high resolution X-ray topography with synchrotron radiation. Acta Polytechnica Scandinavica, Ph. Incl. Nucleonics Series No. 100, (1973), 1-8.
      • T. Tuomi, K. Naukkarinen, P. Rabe: Use of synchrotron radiation in X-ray diffraction topography. phys. stat. sol. a (1974) 25, 93-106.
      • H. Klapper: The influence of elastic anisotropy on the X-ray topographic image width of pure screw dislocations. J. Appl. Cryst. (1975) 8, 204.
      • M. Hart: J. Appl. Cryst. (1975) 8, 436.
      • H. Klapper: The influence of elastic anisotropy on the X-ray topographic image width of pure screw dislocations. J. Appl. Cryst. (1976) 9, 310-317.
      • B.K. Tanner and D. Midgley and M. Safa: J.Appl. Cryst. (1977) 10, 281-286.
      • G.R. Fisher, P. Barnes and J.F. Kelly: Dislocation Contrast in White-Radiation Synchrotron Topography of Silicon Carbide. J. Appl. Cryst. (1993) 26, 677-682.
      • A.R. Lang: J. Phys. D Appl. Phys. (1993) 26, A1.
      • F. Zontone, L. Mancini, R. Barrett, J. Baruchel, J. Härtwig and Y. Epelboin: New Features of Dislocation Images in Third-Generation Synchrotron Radiation Topographs. J. Synchrotron Rad. (1996) 3, 173-184.
      • J. Baruchel, P. Cloetens, J. Härtwig, W. Ludwig, L. Mancini, P. Pernot and M. Schlenker: Phase imaging using highly coherent X-rays: radiography, tomography, diffraction topography. J. Synchrotron Rad. (2000) 7, 196-201.
    • Special applications:
      • J.F. Kelly, P. Barnes and G.R. Fisher: The use of synchrotron edge topography to study polytype nearest neighbour relationships in SiC. Radiat. Phys. Chem. (1995) 45(3), 509-522.
      • K. Wieteska, W. Wierzchowski, W. Graeff, A. Turos, and R. Grötzschel: Characterization of implanted semiconductors by means of white-beam and plane-wave synchrotron topography. J. Synchrotron Rad. (2000) 7(5), 318-325.
      • D. Altin, J. Härtwig, R. Köhler, W. Ludwig, M. Ohler, and H. Klein. X-ray diffraction topography using a diffractometer with a bendable monochromator at a synchrotron radiation source. Journal of Synchrotron Radiation (2002) 9(5), 282-286.
    • Instrumentation and beamlines for topography:
      • J. I. Espeso, P. Cloetens, J. Baruchel, J. Härtwig, T. Mairs, J. C. Biasci, G. Marot, M. Salomé-Pateyron and M. Schlenker: Conserving the Coherence and Uniformity of Third-Generation Synchrotron Radiation Beams: the Case of ID19, a `Long' Beamline at the ESRF. J. Synchrotron Rad. (1998) 5, 1243-1249.

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