History
Traditionally, in the prenanometer era, DFM consisted of a set of different methodologies trying to enforce some soft (recommended) design rules regarding the shapes and polygons of the physical layout of an integrated circuit. These DFM methodologies worked primarily at the full chip level. Additionally, worst-case simulations at different levels of abstraction were applied to minimize the impact of process variations on performance and other types of parametric yield loss. All these different types of worst-case simulations were essentially based on a base set of worst-case (or corner) SPICE device parameter files that were intended to represent the variability of transistor performance over the full range of variation in a fabrication process.
Read more about this topic: Design For Manufacturability (IC)
Famous quotes containing the word history:
“All things are moral. That soul, which within us is a sentiment, outside of us is a law. We feel its inspiration; out there in history we can see its fatal strength.”
—Ralph Waldo Emerson (1803–1882)
“In every election in American history both parties have their clichés. The party that has the clichés that ring true wins.”
—Newt Gingrich (b. 1943)
“To summarize the contentions of this paper then. Firstly, the phrase ‘the meaning of a word’ is a spurious phrase. Secondly and consequently, a re-examination is needed of phrases like the two which I discuss, ‘being a part of the meaning of’ and ‘having the same meaning.’ On these matters, dogmatists require prodding: although history indeed suggests that it may sometimes be better to let sleeping dogmatists lie.”
—J.L. (John Langshaw)