Handler or Prober and Device Test Adapter
ATE can be used on packaged parts (typical IC 'chip') or directly on the Silicon Wafer. Packaged parts use a handler to place the device on a customized interface board, whereas silicon wafers are tested directly with high precision probes. The ATE systems interact with the handler or prober to test the DUT.
Read more about this topic: Automatic Test Equipment
Famous quotes containing the words device and/or test:
“UG [universal grammar] may be regarded as a characterization of the genetically determined language faculty. One may think of this faculty as a ‘language acquisition device,’ an innate component of the human mind that yields a particular language through interaction with present experience, a device that converts experience into a system of knowledge attained: knowledge of one or another language.”
—Noam Chomsky (b. 1928)
“There is held to be no surer test of civilisation than the increase per head of the consumption of alcohol and tobacco. Yet alcohol and tobacco are recognisable poisons, so that their consumption has only to be carried far enough to destroy civilisation altogether.”
—Havelock Ellis (1859–1939)