Handler or Prober and Device Test Adapter
ATE can be used on packaged parts (typical IC 'chip') or directly on the Silicon Wafer. Packaged parts use a handler to place the device on a customized interface board, whereas silicon wafers are tested directly with high precision probes. The ATE systems interact with the handler or prober to test the DUT.
Read more about this topic: Automatic Test Equipment
Famous quotes containing the words device and/or test:
“Irony, forsooth! Guard yourself, Engineer, from the sort of irony that thrives up here; guard yourself altogether from taking on their mental attitude! Where irony is not a direct and classic device of oratory, not for a moment equivocal to a healthy mind, it makes for depravity, it becomes a drawback to civilization, an unclean traffic with the forces of reaction, vice and materialism.”
—Thomas Mann (1875–1955)
“It is the test of a novel writer’s art that he conceal his snake-in-the-grass; but the reader may be sure that it is always there.”
—Anthony Trollope (1815–1882)