Sensitive High-resolution Ion Microprobe
The Sensitive High Resolution Ion Microprobe (SHRIMP) is a large-diameter, double-focusing secondary ion mass spectrometer (SIMS) sector instrument produced by Australian Scientific Instruments in Canberra, Australia. The SHRIMP microprobe focuses a primary beam of ions on a sample sputtering secondary ions which are focussed, filtered and measured according to their energy and mass.
The SHRIMP is primarily used for geological and geochemical applications. It can rapidly measure the isotopic and elemental abundances in minerals at a micrometre-scale and is therefore well-suited for the analysis of complex minerals, as often found in metamorphic terrains, some igneous rocks, and for relatively rapid analysis of statistical valid sets of detrital minerals from sedimentary rocks. The most common application of the instrument is in uranium-thorium-lead geochronology, although the SHRIMP can be used to measure other isotopic and elemental abundances.
Read more about Sensitive High-resolution Ion Microprobe: History and Scientific Impact, Design and Operation, SHRIMP Instruments Around The World
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