Applications Using A Scanning SQUID Microscope
Scanning SQUID Microscope can detect all types of shorts and conductive paths including Resistive Opens (RO) defects such as cracked or voided bumps, Delaminated Vias, Cracked traces/mouse bites and Cracked Plated Through Holes (PTH). It can map power distributions in packages as well as in 3D Integrated Circuits (IC) with Through-Silicon Via (TSV), System in package (SiP), Multi-Chip Module (MCM) and stacked die. SQUID scanning can also isolate defective components in assembled devices or Printed Circuit Board (PCB).
Read more about this topic: Scanning SQUID Microscope
Famous quotes containing the word squid:
“air or vacuum, snow or shale, squid or wolf, rose or lichen,
each is accepted into as much light as it will take,”
—Archie Randolph Ammons (b. 1926)