Established Types of Scanning Probe Microscopy
- AFM, atomic force microscopy
- Contact AFM
- Non-contact AFM
- Dynamic contact AFM
- Tapping AFM
- BEEM, ballistic electron emission microscopy
- CFM, chemical force microscopy
- C-AFM, conductive atomic force microscopy
- ECSTM electrochemical scanning tunneling microscope
- EFM, electrostatic force microscopy
- FluidFM, fluidic force microscope
- FMM, force modulation microscopy
- FOSPM, feature-oriented scanning probe microscopy
- KPFM, kelvin probe force microscopy
- MFM, magnetic force microscopy
- MRFM, magnetic resonance force microscopy
- NSOM, near-field scanning optical microscopy (or SNOM, scanning near-field optical microscopy)
- PFM, Piezoresponse Force Microscopy
- PSTM, photon scanning tunneling microscopy
- PTMS, photothermal microspectroscopy/microscopy
- SCM, scanning capacitance microscopy
- SECM, scanning electrochemical microscopy
- SGM, scanning gate microscopy
- SHPM, scanning Hall probe microscopy
- SICM, scanning ion-conductance microscopy
- SPSM spin polarized scanning tunneling microscopy
- SSRM, scanning spreading resistance microscopy
- SThM, scanning thermal microscopy
- STM, scanning tunneling microscopy
- STP, scanning tunneling potentiometry
- SVM, scanning voltage microscopy
- SXSTM, synchrotron x-ray scanning tunneling microscopy
Of these techniques AFM and STM are the most commonly used for roughness measurements.
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