Further Reading
- sst.pennnet.com
Kinam Kim, "Technology for sub-50nm DRAM and NAND flash manufacturing," Electron Devices Meeting, 2005. IEDM Technical Digest, pp. 323– 326.
Sanghun Jeon, et al. "High work-function metal gate and high-κ dielectrics for charge trap flash memory device applications," IEEE Trans. Elect. Dev., vol. 52 no. 12, pp. 2654–2659, Dec. 2005.
Read more about this topic: Charge Trap Flash
Famous quotes containing the word reading:
“It is one of the signs of the times. We confess that we have risen from reading this book with enlarged ideas, and grander conceptions of our duties in this world. It did expand us a little.”
—Henry David Thoreau (1817–1862)
“A reading machine, always wound up and going,
He mastered whatever was not worth the knowing.”
—James Russell Lowell (1819–1891)