Static secondary-ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or plastic with insignificant disturbance to its composition and structure. It is one of the two principal modes of operation of SIMS, which is the mass spectrometry of ionized particles emitted by a solid (or sometimes liquid) surface upon bombardment by energetic primary particles.
Read more about Static Secondary-ion Mass Spectrometry: Mechanism, Primary Operating Conditions, Spectrum, History of Static SIMS
Famous quotes containing the word mass:
“Life is a series of diminishments. Each cessation of an activity either from choice or some other variety of infirmity is a death, a putting to final rest. Each loss, of friend or precious enemy, can be equated with the closing off of a room containing blocks of nerves ... and soon after the closing off the nerves atrophy and that part of oneself, in essence, drops away. The self is lightened, is held on earth by a gram less of mass and will.”
—Coleman Dowell (1925–1985)