SFTL

With the wide applicability of flash memory in various application domains, reliability has become a very critical issue. The SFTL is motivated by the needs to resolve the lifetime problem of flash memory and a strong demand in turning thrown-away flash-memory chips into downgraded products. A set-based mapping strategy is proposed with an effective implementation and low resource requirements, such as SRAM. A configurable management design and the wear leveling issue are considered. The behavior of the proposed method is also analyzed with respect to popular implementations in the industry. By applying SFTL, The endurance of flash memory can be significantly improved by a series of experiments over a realistic trace. Meanwhile, the read performance is even largely improved in the experiments.