S
- SAD - Selected area diffraction
- SAED - Selected area electron diffraction
- SAM - Scanning Auger microscopy
- SANS - Small angle neutron scattering
- SAXS - Small angle X-ray scattering
- SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation
- SCEM - Scanning confocal electron microscopy
- SE - Spectroscopic ellipsometry
- SEC - Size exclusion chromatography
- SEIRA - Surface enhanced infrared absorption spectroscopy
- SEM - Scanning electron microscopy
- SERS - Surface enhanced Raman spectroscopy
- SERRS - Surface enhanced resonance Raman spectroscopy
- SEXAFS - Surface extended X-ray absorption fine structure
- SICM - Scanning ion-conductance microscopy
- SIL - Solid immersion lens
- SIM - Solid immersion mirror
- SIMS - Secondary ion mass spectrometry
- SNMS - Sputtered neutral species mass spectrometry
- SNOM - Scanning near-field optical microscopy
- SPECT - Single photon emission computed tomography
- SPM - Scanning probe microscopy
- SRM-CE/MS - Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry
- SSNMR - Solid-state nuclear magnetic resonance
- Stark spectroscopy - Stark spectroscopy
- STED - Stimulated Emission Depletion microscopy
- STEM - Scanning transmission electron microscopy
- STM - Scanning tunneling microscopy
- STS - Scanning tunneling spectroscopy
- SXRD - Surface X-ray Diffraction (SXRD)
Read more about this topic: List Of Materials Analysis Methods