Example Test Sequence
- Discharging capacitors and especially electrolytic capacitors (for safety and measurement stability, this test sequence must be done first before testing any other items)
- Contact Test (To verify the test system is connected to the Unit Under Test(UUT)
- Shorts testing (Test for solder shorts and opens)
- Analog tests (Test all analog components for placement and correct value)
- Testjet (Agilent), FrameScan (Genrad/Teradyne), QTest2-Probe (Aeroflex) or ElectroScan (SPEA) (Test for defective open pins on devices)
- CODA test (Aeroflex) (Test for capacitor orientation defect analyse)
- Power up UUT
- Powered analog (Test for correct operation of analog components such as regulators and opamps)
- Powered digital (Test the operation of digital components and Boundary scan devices)
- JTAG Boundary scan tests
- Flash, ISP and other device programming
- Agilent Medalist Beadprobe - Bead probe technology
- Agilent/Teradyne Powered Vectorless Test Solution – VTEP v2.0/Powered FrameScan
- Discharging capacitors as UUT is powered down
While in-circuit testers are typically limited to testing the above devices, it is possible to add additional hardware to the test fixture to allow different solutions to be implemented. Such additional hardware includes:
- Cameras to test for presence and correct orientation of components
- Photodetectors to test for LED color and intensity
- External timer counter modules to test very high frequencies (over 50 MHz) crystals and oscillators
- Signal waveform analysis, e.g. slew rate measurement, envelope curve etc. (FA08 card Aeroflex)
- External equipment can be used for hi-voltage measurement (more than 100Vdc due to limitation of voltage that is provided) or AC equipment Source those have interface to PC as the ICT Controller
Read more about this topic: In-circuit Test
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