Facilities
Microscopy Technique | Instrument | Additional Facilities | Notes |
---|---|---|---|
Scanning Electron Microscopy | FEI QUANTA 600 FEG SEM | Wavelength and Energy Dispersive X-ray Spectroscopy, micromanipulator, hot stage (20-1200C) | Equipped with a Field emission gun |
Environmental Scanning Electron Microscopy | FEI QUANTA 600 FEG ESEM | Freeze drying and cryo stage, miniature tensiometer | |
Low Pressure Scanning Electron Microscopy | LEO 450VP SEM | Energy Dispersive X-ray Spectroscopy, miniature tensiometer | |
Scanning Electron Microscopy | Cambridge Stereoscan | Energy Dispersive X-ray Spectroscopy | |
Analytical Transmission Electron Microscopy | Philips CM20 | Energy Dispersive X-ray Spectroscopy | |
High Resolution Transmission Electron Microscopy | JEOL 2010 | High sensitivity CCD Camera | |
Scanning probe microscopy | Liquid stage, magnetic probe, heating stage, electrochemical cell, environmental chamber | AFM mode MFM Mode | |
Infra Red Microscopy | Bruker | Heating stage | |
Raman Microscopy | Renishaw | tensile and biaxial deformation stages, hot stage | 633 excitation |
Raman Microscopy | Renishaw | 450 and 850 excitation |
Read more about this topic: Centre For Advanced Microscopy (University Of Reading)
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