Components of ATE
The Semiconductor ATE architecture consists of master controller (usually a computer) that synchronizes one or more source and capture instruments (listed below). Historically, custom-designed controllers or relays were used by ATE systems. The Device Under Test (DUT) is physically connected to the ATE by another robotic machine called a Handler or Prober and through a customized Interface Test Adapter (ITA) or "fixture" that adapts the ATE's resources to the DUT.
Read more about this topic: Automatic Test Equipment
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