Automatic Test Markup Language (ATML) is a collection of XML Schemas that allows Automatic Test Systems (ATS) to exchange test information in a common format adhering to the XML standard.
The purpose of ATML is to support test programs, test asset, and unit under test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between the various components of the test system.
The family of standards are developed by IEEE Standards Coordinating Committee 20 (SCC20) and are composed of
- ATML IEEE Std 1671 Base Standard
- Test Description IEEE Std 1671.1
- Instrument Description IEEE Std 1671.2
- UUT Description IEEE Std 1671.3
- Test Configuration Description IEEE Std 1671.4
- Test Adaptor Description IEEE Std 1671.5
- Test Station Description IEEE Std 1671.6
- Signal and Test Definition IEEE Std 1641
- Test Results IEEE Std 1636.1
Typically ATML information would be used in the following scenarios:
- Data that will be utilized for the design, development, and utilization of automatic test equipment(ATE)
- Data that will be utilized for the design, development, and utilization of test program sets (TPSs) to test a product (e.g. UUT) on a particular ATE.
- Product design data that will be utilized during the testing of the product (e.g. UUT).
- Shared usage of maintenance data and the results of testing a product (e.g. UUT).
- Testing requirements of a particular product (e.g. UUT).
- Data that will be utilized for the design, development, and utilization of instrumentation that will be utilized within a particular ATS configuration.
- A definition of allowable ATS configurations that can be use to test and evaluate a particular product (e.g. UUT).
- A definition of the capabilities of ATSs as well as the resources within the ATS.
- Recording and exchanging values of measurements and tests